In general, IC testing sockets are equipped with an extendable rod-shaped probe pin (inspection pin) called a pogo pin, which is used as a part to electrically connect the PC board on the inspection equipment side and the DUT. The pogo pin consists of three main parts: plunger, barrel, and spring. The pogo pin is also called a probe pin, spring probe, or contact probe. However, with the acceleration of miniaturization, multi-functionality, and high-density mounting of device, inspection needs that are difficult to meet with the pogo pin, such as high inspection stability, long operating life, narrow pitch, and low contact resistance, are becoming more apparent.

OMRON’s testing sockets use a probe pin (commonly known as a blade pin) manufactured using OMRON’s proprietary^*1 EFC process technology. The blade pin has a completely different structure from the pogo pin and is characterized by its ability to reproduce a complex pin shape in a single component structure. OMRON can custom design and propose the contact shape suitable for the device under test (DUT). OMRON’s probe pins use original materials^*2 with excellent hardness and spring property. The probe pins outperform pogo pins with four key advantages: high durability, low contact resistance, high inspection pass rate, and narrow pitch.

^*1 Two patents (US8337261; US2013/0045617) have been granted for the electroforming technology to form the contact structure and its manufacturing process.
^*2 Patent No. 5077479

Displays for computers, televisions, smartphones, and other devices are evolving rapidly. With the emergence of products that are clearer and more sensitive to operation, OLEDs (organic light emitting diodes) are gaining attention. Liquid crystals, which are often used as conventional displays, do not emit light by themselves and require a separate light source. However, OLEDs, which are LEDs using an organic substance as the light-emitting material, emit light spontaneously when electric current is applied, so they do not require a separate light source. Therefore, it is possible to configure very thin and light displays that meet today’s display needs.

OMRON’s blade pins have an extremely high inspection pass rate of 99 to100%. Less than 1% of products are rejected due to testing pin contact failures, which contributes to the reduction of customers’ product disposal losses and allows inspections to be carried out with high production efficiency. The high inspection pass rate also benefits defect analysis. Defect analysis of products is one of the important factors for creating better new products. However, if there are many rejected items due to reasons on the inspection equipment side, it is not possible to correctly analyze what is the cause of the defect. OMRON’s blade pins virtually eliminate rejects due to contact failure between the testing pin and the terminal of the device under test (DUT). By reducing the defect factors caused by the inspection equipment as much as possible, more accurate product defect analysis results can be properly reflected in the product.

OMRON can provide testing pins for a pitch width of 0.35mm or less which is difficult to achieve with pogo pins. OMRON’s blade pins can handle a narrow pitch down to 0.175mm, enabling highly accurate inspection even for camera and display modules which are becoming increasingly multifunctional due to high-density mounting. Please feel free to contact us.

OMRON’s testing sockets and pins for extremely small electronic components are created by combining EFC process technology and extensive know-how in electronic component design. Our EFC process technology is a type of electroforming microfabrication technology. This technology makes it possible to reproduce high-precision, complex shape processing in an extremely small size which was difficult to achieve with conventional press working, etc.

The EFC process technology provides customers with four values that are difficult to achieve with other technologies.