Improving Automated Test Equipment Product Life and Board Density


Join OMRON's upcoming webinar this July to understand more on the latest signal relay and blade pin technologies to enable the advancement of automated test equipment and the next generation of semiconductors. We will elaborate on the current needs of the ATE market and go in depth on the latest solutions that OMRON is releasing to meet them. Discover how these relays and blade pins can help provide longer product life, save on board space, and improve test reliability in your next test design.

In this webinar, learn how to:

  • Utilize LED operated MOSFET Relays with stable ON Resistance for millions of cycles
  • Incorporate a variety of small MOSFET Relay package sizes to help save board space and increase density
  • Keep device inspection equipment running longer with high durability EFC Blade Pins


Evan Kuhn
Business Development Manager

Evan Kuhn attended Northern Illinois University, where he obtained his Bachelor of Science in Electrical Engineering Technology. Starting as a Product Marketing Intern with Omron, Evan began his career in Inside Sales after school and then became the Territory Manager for the Pacific Northwest. Currently residing in Seattle, he is now Omron’s Business Development Manager for the Automated Test Equipment and AI Integration Industries.