Solutions for Automated Test Equipment
Semiconductor-based parts are components used in a variety of devices such as smartphones, robots, automobiles, and home electric appliances, which are indispensable for our lives. There are many kinds with different functions, circuits, and structures.
These semiconductor devices are becoming more sophisticated each day, and automated test equipment must be highly accurate and maintain stability to conduct electrical tests to verify the performance, quality and reliability of these devices. The requirements of growing industries for automated test equipment are superior flexibility, scalability, long life, high throughput, minimal maintenance, and downsizing to achieve low cost of testing as well as greater testing reliability.
Omron contributes to higher performance of your test equipment by offering high quality components and innovative products to satisfy your needs.
Please select the applicable application below. Omron recommended products for each application will be suggested.
IC test system / IC test handler SOC test system
Memory test system
RF test system Logic handler
Memory handler Resource card
Interface boardSemiconductor wafer test system Automated test equipment
Probing machine
Wafer handler Probe card
Performance board
Resource cardIn-circuit tester ICT, Printed circuit board Tester
PCBA tester
Inline In-circuit PCB tester Functional tester
Flying probe tester
Physical layer testerGeneral tester Electronic measuring instrument
Digital multi meter
Oscilloscope Power analyzer
Signal analyzer
Network analyzer Signal generator
PXI system
DAQ systemInline test equipment for portable devices and module parts Battery-driven device
Display module
Smart phone
Camera module
Wearable device
Communication module Laptop/Tablet computer
Handheld gaming console
Portable hard drive e-cigarette
Portable Battery
VR Headset

1IC test system
- Relay
- Connector
- Switch
- Micro sensing device


-
- 1Instrument / Interface board
- Test signal switching
MOS FET RelayG3VM series- Low CxR type
- High-speed response type
- High Temperature Compatible type
- Ultra-Compact type
- High Load Voltage type
- Other types
G6K-RF High frequency compatible(up to 3GHz)
G6K-RF-V High frequency compatible(up to 8GHz)
-
- 2Resource card / interface board
- Signal / power supply connection
MIL connectorsXG2/4/5Serial communication (i.e.RS232C)
D-sub connectorsXM2/3
- 3Control panel
- Settings
Tactile switchesB3SL/B3FS
- 4Module board
- Board signal change setting
DIP switchesA6TN/A6SN
-
- 5IC handling mechanism
- Toray / PC board detection
Light convergent reflective sensorB5W-LB
- 6Handling mechanism
- Mechanism positioning
Miniature basic switchD3V/SS/D2F
2Semiconductor wafer test system
- Relay
- Connector
- Switch

-
- 1Instrument / Interface board
- Test signal switching
MOS FET RelayG3VM series- Low CxR type
- High-speed response type
- High Temperature Compatible type
- Ultra-Compact type
- High Load Voltage type
- Other types
G6K-RF High frequency compatible(up to 3GHz)
G6K-RF-V High frequency compatible(up to 8GHz)
-
- 2Resource card / interface board
- Signal / power supply connection
MIL connectorsXG2/4/5Serial communication (i.e.RS232C)
D-sub connectorsXM2/3
- 3Sensor to board
- Wiring for sensors
e-CON connectorXN2
-
- 4Control panel
- Settings
Tactile switchesB3SL/B3FS
3In-circuit electrical tester
- Relay
- Connector
- Micro sensing device
- Switch

-
- 1Instrument / Interface board
- Test signal switching
MOS FET RelayG3VM series- Low CxR type
- High-speed response type
- High Temperature Compatible type
- Ultra-Compact type
- High Load Voltage type
- Other types
G6K-RF High frequency compatible(up to 3GHz)
G6K-RF-V High frequency compatible(up to 8GHz)
-
- 2Resource card / interface board
- Signal / power supply connection
MIL connectorsXG2/4/5Serial communication (i.e.RS232C)
D-sub connectorsXM2/3
- 3Board contacting mechanism
- Mechanism positioning
PhotomicrosensorEE-SX
-
- 4Board contacting mechanism
- Mechanism positioning
Miniature basic switchD3V/SS/D2F
- 5Control panel
- Settings
Tactile switchesB3SL/B3FS
- 6Resource card
- Board signal change setting
DIP switchesA6TN/A6SN
4General Electrical Tester
- Relay
- Connector
- Switch


-
- 1Instrument / Interface board
- Test signal switching
MOS FET RelayG3VM series- Low CxR type
- High-speed response type
- High Temperature Compatible type
- Ultra-Compact type
- High Load Voltage type
- Other types
G6K-RF High frequency compatible(up to 3GHz)
G6K-RF-V High frequency compatible(up to 8GHz)
-
- 2Resource card / interface board
- Signal / power supply connection
MIL connectorsXG2/4/5
- 3I/O board
- Serial communication (i.e.RS232C)
D-sub connectorsXM2/3
-
- 4Operation panel, I/O board
- Set/reset switching
Tactile switchesB3F/B3FSBoard signal change setting
DIP switchesA6TN/A6SN
5Test equipment for module parts / test equipment for portable devices
- Relay
- Connector




-
- 1Instrument / Interface board
- Test signal switching
MOS FET RelayG3VM series- Low CxR type
- High-speed response type
- High Temperature Compatible type
- Ultra-Compact type
- High Load Voltage type
- Other types
G6K-RF High frequency compatible(up to 3GHz)
G6K-RF-V High frequency compatible(up to 8GHz)
-
- 2Electrical test process for devices
- Electrical test for final assembly
USB module test socketXP2U
-
- 3I/O board
- Serial communication (i.e.RS232C)
D-sub connectorsXM2/3
- 4Resource card, I/O board
- Signal / power supply connection
MIL connectorsXG2/4/5
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